ECA Probes for Tube Inspection
Eddy current array probes for tube inspection deliver superior axial defect detection compared to conventional bobbin probes. With C-scan imaging capability, they provide precise defect characterization for fitness-for-service assessments in heat exchangers and condensers.
- Detection of circumferential cracks anywhere in the tube, including tube-sheet and support locations.
- Full-length tube inspection with speeds almost equal to the ECT standard speed (1 m/s), replacing rotation pancake probes.
- 2-D and 3-D C-scan representation for maximum understanding of signals using the MultiView C-scan option.
- Solid and durable titanium construction.
Eddy Current Array Tube Probes
Thickness and Flaw Inspection Solutions
TXE - Attached
The new TXE probe series is the best at detecting circumferential cracks, particularly those located at the edge of supports or tube sheets. The output display is an intuitive C-scan image, and in addition, the probe can be used to scan the whole length of the tube at very high speeds.
Recommendations
TXE probes are designed to be used for the detection of circumferential cracks in stainless steel tubing.
Standard/Custom Probes (Made to Order)
Use the nomenclature and the chart below to configure your part number.
| Probe Type | Coils Disposition | Probe Diameter(use mm in part ID) | Frequency Level | Cable Length | |
| mm | in. | ||||
| TXE: Eddy current array tube probe | R8: 8 reflection coils | Standard13.8 mm to 24 mmby 0.2 mm | Standard0.543 in. to 0.945 in.by 0.008 in. | MF: Medium frequency optimized for stainless steel. | 20 m (65 ft) |
Probe Response
The TXE-series eddy current array probes have independent channels that enable generation of C-scan views for easier analysis.
CT02 ECT Evident NDT Calibration Tube C-Scan
Circumferential cracks (75% and 50% at the support)
Key Features
- Detection of circumferential cracks anywhere in the tube, including tube-sheet and support locations.
- Full-length tube inspection with speeds almost equal to the ECT standard speed (1 m/s), replacing rotation pancake probes.
- 2-D and 3-D C-scan representation for maximum understanding of signals using the MultiView C-scan option.
- Solid and durable titanium construction.
- No multiplexer required. Direct connection to the standard MS 5800 EC extended connector.
- Option to use up to four frequencies with mixing, and all with C-scan displays.
