OmniScan X4 Phased Array Flaw Detector
Versatile PA · TFM · PCI · 128:128PR — All in One Portable Toolbox
Key Features
- Multi-Technology: PA, TFM, PCI & twin TFM/PCI in a single portable unit.
- 3× Faster TFM: Up to 3× faster TFM acquisition versus the previous generation.
- 128:128PR Config: Full 128-element pulsing in the same compact, field-ready design.
- Phase Coherence Imaging: Detect hook cracks and SCC with certainty.
- Compact & Rugged: Built for demanding field environments with high portability.
Detect and interpret challenging flaws and identify damage earlier with the powerful, yet portable OmniScan™ X4 multitechnology flaw detector. Exploit its versatile PA, faster TFM, innovative PCI, and efficient twin TFM/PCI to perform rapid and reliable inspections of welds and components.
Multitechnology Toolbox
What the Experts Use
A portable yet powerful solution, the speed and versatility of the OmniScan™ X4 multitechnology series boosts your productivity while increasing confidence in your assessments. Exploit its advanced phased array capabilities, efficient total focusing method (TFM), and innovative phase coherence imaging (PCI) to detect and interpret challenging flaws and secure the integrity of your assets by identifying damage earlier.
Request QuoteExpanded Capabilities
OmniScan X4 128:128PR — Next Level Power
Take on more complex challenges with confidence while keeping your equipment lightweight and field-ready.
- 128-Element Pulsing: Flexibility to develop new PAUT applications requiring 128-element pulsers.
- Compact Design: Full 128:128 power in the same portable and durable enclosure.
- Upgrade Path: Upgrade your existing OmniScan X4 64:128PR — no full replacement needed.
- Improved Focalization: Enhanced steering functionality for demanding applications.
- Matrix Probes: Support for linear and matrix probes beyond 64 elements.
Phase Coherence Imaging
Assess with Certainty Using PCI
Eliminate doubt through phase coherence imaging's capacity to detect and accentuate historically difficult-to-detect flaws, including hook cracks and stress corrosion cracking (SCC). Use PCI to clearly distinguish individual flaws in colonies of fine cracks and characterize them with certainty.
- Hook Cracks & SCC: Detects flaws that traditional PA often misses.
- Colony Discrimination: Separates individual flaws in complex crack fields.
- Twin TFM/PCI: Run both simultaneously for maximum throughput.
Total Focusing Method
3× Faster TFM Acquisition Rate
Obtain crisp TFM imaging at up to three times faster acquisition rates compared to the previous generation, dramatically reducing inspection time without compromising image quality. The OmniScan X4's TFM delivers the most detailed view of material integrity available in a portable device.
- 3× Speed Gain: Dramatically reduce scan time on large components.
- Crisp Imaging: High-resolution reconstruction of the inspection zone.
- Proven to Perform: Trusted by NDT professionals worldwide.
OmniScan X4 Accessories & Software
Technical Specifications
Comprehensive specifications for the OmniScan X4 Phased Array Flaw Detector.
Primary Applications
The OmniScan X4 handles a wide range of demanding inspection scenarios:
- Weld Inspection: Full-volumetric phased array scanning of butt, fillet, and nozzle welds in oil & gas, power generation, and structural fabrication.
- Corrosion Mapping: Encoded C-scan thickness mapping of pipes, vessels, and tanks for integrity management programs.
- Stress Corrosion Cracking (SCC): PCI detection of HISC, SCC, and hook cracks that are invisible to conventional PA.
- Aerospace Composites: Delamination, porosity, and impact damage detection in CFRP and GFRP structures.
- Power Generation: Turbine blade, rotor, and heat exchanger tube inspection in nuclear and thermal power plants.
Resource Downloads
Access product documentation and software for the OmniScan X4.
